International

Electrotechnical

Area		Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection / Materials for Surface Acoustic Wave (SAW) devices

IEV ref		561-07-02

en		back surface roughness
		roughness that scatters and suppresses spurious bulk waves at the back surface of a wafer
		[SOURCE: IEC 62276:2016, 3.6.4, modified — Grammar corrected and "of a wafer" added.]

fr		rugosité de la face arrière, f
		rugosité qui disperse et supprime les ondes de volume parasites sur la face arrière de la plaquette
		[SOURCE: IEC 62276, 3.6.4, modifiée — Ajout de ”de la plaquette”.]

ar		خشونة السطح الخلفي

de		Rückflächenrauigkeit, f

es		rugosidad de la superficie trasera

it		rugosità della superficie posteriore

ko		후면 표면 거칠기

ja		裏面粗さ

pl		chropowatość powierzchni tylnej, f

pt		rugosidade da face traseira

zh		背面粗糙度

Publication date: 2021-08