International Electrotechnical Commission
Glossary

Terms defined in IEC 61967-1


3.1artificial network, AN
3.2associated equipment
3.3auto sweep
3.4broadband emission
3.5common mode voltage; asymmetrical voltage
3.6common mode current
3.7conducted emissions
3.8continuous disturbance
3.9device under test, DUT
3.10die shrink
3.11differential mode current
3.12differential mode voltage
3.13discontinuous disturbance
3.14electrically small PCB
3.15electromagnetic compatibility, EMC
3.16electromagnetic emission
3.17electromagnetic radiation; radiated emissions
3.18emission limit (from a disturbing source)
3.19ground (reference) plane
3.20lead frame
3.21measuring receiver
3.22multi-chip module, MCM
3.23multi IC sets
3.24narrowband emission
3.25peak detector
3.26preamp noise floor
3.27receiver terminal voltage
3.28reference point
3.29repetition rate
3.30electromagnetic environment (RF ambient)
3.31shielded enclosure
3.32significant IC changes
3.33system gain
3.34test plan