IEVref:395-03-43ID:
Language:enStatus: Standard
Term: differential d<i>E</i>/d<i>x</i> semiconductor detector
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Definition: transmission semiconductor detector whose sensitive volume thickness is very small compared to the range of the incident particles and where the thickness of the entrance and exit dead layers is small compared to the sensitive volume thickness of the detector

Note 1 to entry: This entry was numbered 394-28-09 in IEC 60050-394:2007.


Publication date:2014-03
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